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Capacitor Temperature Characteristic Evaluation System Product List

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Capacitor Temperature Characteristic Evaluation System F-300

Significantly reduce the number of wiring connections to improve maintainability!

The F-300 is a system that measures the equivalent series resistance (ESR), loss factor (tanδ), capacitance (C), impedance (Z), and other parameters of the device under test (DUT) using an LCR meter, evaluating frequency characteristics in any temperature environment. With the uniquely developed LCR multi-scan unit from Shin-ei, we have significantly reduced the number of cables. This makes maintenance, such as installation and relocation, easier. Additionally, we will provide a temperature-controlled chamber and an application (developed separately) to operate this system according to customer requirements. We are also flexible in accommodating replacements from existing systems, as well as adding, changing, or customizing functions.

  • Thermostatic chamber
  • Capacitor Temperature Characteristic Evaluation System

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Capacitor Temperature Characteristic Evaluation System (Dielectric Property Evaluation)

Automatic recording of capacitor parameters for temperature and frequency characteristics.

Developed a "Capacitor Insulation Degradation Testing System" that enables automatic evaluation of insulation degradation characteristics of capacitors under high temperature and high humidity testing environments. This system applies voltage to capacitors in any high temperature (high humidity) testing environment and captures leakage current caused by insulation breakdown. It is an automatic measurement system equipped with various data processing and analysis functions, including display of leakage current generation due to insulation breakdown, failure detection and calculation, and failure analysis based on cumulative hazard.

  • Capacitor
  • Capacitor Temperature Characteristic Evaluation System

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